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Publication Information
Title Effects of Intensity and Position Modulation On Switched Electrode Electronics Beam Position Monitor Systems at Jefferson Lab*
Abstract Two types of switched electrode electronics beam position monitors are in use at Jefferson Lab. Together they provide accurate beam position to the control system for beam intensities between 50 nA and 2 mA. One version, called the linac style, has a switching frequency of 125 kHz. The other, called the transport type, has a switching frequency of 7 kHz. The basic system provides information to the control system at a 1 Hz update rate. The systems are regularly used to measure the AC component of beam position and energy as well as suppress this motion as part of a fast feedback system. Position data produced by the system are also acquired on an event by event basis as part of the nuclear physics program in two of the experimental halls. This paper will focus on the AC characteristics of the system. These characteristics are affected by analog filter frequencies and a time delay between the measurement of the positive electrode signal and the negative electrode signal. The errors intr
Author(s) Tom Powers
Publication Date November 2000
Document Type Meeting, Proceedings
Primary Institution Thomas Jefferson National Accelerator Facility, Newport News
Affiliation / /
Funding Source
Proprietary? No
This publication conveys Technical Science Results
Document Numbers
JLAB Number: JLAB-ACT-00-09 OSTI Number: 760443
LANL Number: Other Number: DOE/ER/40150-1744
Associated with an experiment No
Associated with EIC No
Supported by Jefferson Lab LDRD Funding No
Meeting / Conference
Meeting Name 9th Beam Instrumentation Workshop (BIW 2000), 8-11 May 2000, Cambridge, Massachusetts
Meeting Date 5/1/2000
Document Subtype Paper (proceedings only)
Proceedings
Title AIP Conference Proceedings Volume 546
Editor(s)
Publisher AIP
Refereed Yes
Page Number 541-546
Year 2000
Attachments/Datasets/DOI Link
Document(s)
ACT00-09.pdf (STI Document)
DOI Link
Dataset(s) (none)
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