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Publication Information
Title Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing
Abstract The operating lifetime of GaAs-based photocathodes in DC high voltage electron photo-guns is dominated by the ionization rate of residual beamline gas molecules. Ions created within the photo-gun potential are accelerated toward the photocathode, leading to a reduction of the photocathode quantum efficiency (QE). In this work, experiments were performed to quantify the improvement in photocathode charge lifetime by biasing the photo-gun anode with a positive voltage, which repels ions generated downstream of the anode. The method was tested by successively applying and removing the anode bias voltage of the CEBAF photo-gun at the Thomas Jefferson National Accelerator Facility over many months of beam production. The photocathode charge lifetime improved by almost a factor of two when the anode was biased compared to the usual grounded configuration. Simulations were performed using the particle tracking code General Particle Tracer (GPT) with a new custom element and electric field mod
Author(s) Joshua Yoskowitz, Joe Grames, Geoffrey Krafft, John Hansknecht, Carlos Hernandez-Garcia, Matthew Poelker, Gabriel Palacios-Serrano, Marcy Stutzman, Riad Suleiman, Sebastiaan Van der Geer, W. Sajini Wijethunga
Publication Date August 2021
Category Electron/Positron Sources
Document Type Meeting, Proceedings
Primary Institution Thomas Jefferson National Accelerator Facility, Newport News
Affiliation Accelerator Ops, R&D / Ctr For Injectors&Sources / Ctr for Injectors&Sources
Funding Source Nuclear Physics (NP)
Proprietary? No
This publication conveys Technical Science Results
Document Numbers
JLAB Number: JLAB-ACC-21-3485 OSTI Number: 1827698
LANL Number: Other Number: DOE/OR/23177-5339
Associated with an experiment No
Associated with EIC No
Supported by Jefferson Lab LDRD Funding No
Meeting / Conference
Meeting Name IPAC21
Meeting Date 5/24/2021
Document Subtype Paper (proceedings only)
Proceedings
Title Proceedings of IPAC 2021
Editor(s) Liu Lin, John M. Byrd, Regis Neuenschwander, Renan Picoreti, Volker R. W. Schaa
Publisher JACOW
Refereed No
Page Number 2840-2842
Year 2021
Attachments/Datasets/DOI Link
Document(s)
wepab104.pdf (STI Document)
wepab104.pdf (Accepted Manuscript)
DOI Link
Dataset(s) (none)
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