STI Publications - View Publication Form #17143
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Publication Information
| Title | Insight to the Duration of 120 ¿C Baking on the Performance of SRF Niobium Cavities | ||||
| Abstract | Low-temperature baking at 100 - 140 C in ultra-high vacuum for several hours is the final cavity processing technique to achieve the highest accelerating gradient cavity by eliminating the high field Q-slope, typically on cavities made of high purity fine grain niobium and subjected to electropolishing. The temperature and duration of baking control the onset of the high field Q-slope and overall quality factor over the baseline measurements. The increase in quality factor is generally related to the reduction in the temperature-dependent surface resistance, which refers to BCS surface resistance due to the reduction in the electronic mean free path and elimination of high field Q-slope is still being actively investigated. Here, we present the results of a series of measurements on 1.3 GHz TESLA shape single-cell cavities with successive low-temperature baking at 120 C up to 96 hours. The rf loss related to the trapping of residual magnetic field refer to flux trapping sensitivity was | ||||
| Author(s) | Bashu Dev khanal, Pashupati Dhakal | ||||
| Publication Date | April 2023 | ||||
| Category | SRF Technology | ||||
| Document Type | Journal Article | ||||
| Primary Institution | Thomas Jefferson National Accelerator Facility, Newport News | ||||
| Affiliation | Accelerator Ops, R&D / Inst for SRF Sci & Tech / SRF Research & Dev | ||||
| Funding Source | Nuclear Physics (NP), Office of HE Awards No. DE- SC 0009960 | ||||
| Proprietary? | No | ||||
| This publication conveys | Technical Science Results | ||||
| Document Numbers |
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| Associated with an experiment | No | ||||
| Associated with EIC | No | ||||
| Supported by Jefferson Lab LDRD Funding | No |
Journal Article
| Journal Name | IEEE Transactions in Applied Superconductivity |
| Refereed | No |
| Volume | 33 |
| Issue | 3 |
| Page(s) |
Attachments/Datasets/DOI Link
| Document(s) |
120CBake_IEEE.pdf
(STI Document)
120CBake_IEEE_Khanal_Dhakal.pdf
(Accepted Manuscript)
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| DOI Link | |
| Dataset(s) | (none) |
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